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LTTL- 3DS Multifunctional defect fluorescence Spectrometer

2025-03-17 Update From: SLTechnology News&Howtos shulou NAV: SLTechnology News&Howtos > Servers >

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LTTL- 3DS multi-function defect fluorescence spectrometer is a measuring device for measuring the three-dimensional spectrum of solid light-emitting materials by Beijing Liexin Technology. Thermoluminescence three-dimensional luminescence spectrum, that is, the determination of three-dimensional spectrum including temperature, wavelength and luminescence intensity is helpful to identify the type of luminescence center and understand the related defect structure, and provide more abundant parameters for understanding the luminescence mechanism of thermoluminescence. LTTSL- 3DS adds excitation light sources, including X-ray, ultraviolet and infrared light sources, and refrigerated highly sensitive stability probes to improve three-dimensional spectral quality, and can also measure the luminescence spectra of materials under light excitation.

The instrument can realize the temperature control from liquid nitrogen temperature (80K) to high temperature (773K), and can analyze the shallow level traps in luminescent materials, which is especially suitable for the research of luminescent materials such as scintillators and long afterglow materials. The instrument has the advantages of reliable quality, beautiful shape, easy to use, stable and accurate temperature control, and involves a number of patented technologies. The instrument adopts a modular design, which can increase or decrease according to the needs of users, and can meet the needs of customers at different levels.

Main technical performance:

L implement a variety of measurement modes:

1) thermoluminescence three-dimensional spectrum

2) thermoluminescence curve

3) Photoluminescence three-dimensional spectrum

4) Photoluminescence curve

5) radioluminescence spectrum measurement

6) Afterglow attenuation spectrum measurement

7) Measurement of afterglow attenuation curve

8) X-ray fluorescence spectrum measurement

L in situ X-ray and UV excitation mode, X-ray tube voltage: 0-50kV, tube current: 0-200 μ A, parameters adjustable

L Spectral measurement uses high sensitivity CCD spectral measurement system, wavelength measurement range: 350-1000nm (optional)

L wavelength measurement resolution: 1-10nm (depending on grating and slit)

L measuring probe: single photon PMT detector, spectral response range 300-650nm, linear range of counting rate greater than 2 × 106 picks.

L liquid nitrogen refrigeration system

L adopt high stability heater, temperature measurement range: 80K-773K, heating rate range: 0.1-5K/s, temperature stability: less than ±0.5K (60s continuous observation)

Various measuring stages such as irradiation excitation, preheating, measurement and annealing can be set, and the temperature, time and heating rate of each stage can be adjusted.

Sample size: diameter less than 10mm, thickness less than 1mm

L optional continuous spectrum light source (optional Monochromator, xenon lamp), different wave band laser light source

L USB data interface

L instrument output data format: including binary and text formats, which can be further analyzed by data analysis software

L control software running environment: Windows XP, Windows7 and other operating systems. Provide functions such as curve viewing, 3D spectrum display and heating curve display.

L instrument parameter setting calibration: including calibration parameters of heating system and spectral system

L automatic background deduction function, which can set the time for measuring background signal

L provide matching thermoluminescence analysis software, built-in thermoluminescence first-order, second-order, general polar dynamics model, and can further fit the luminescence curve, solve the spectrum analysis, etc.

L input power supply: AC220 ±10% 50/60Hz, maximum power 500W.

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